Paper Title:
Structural Defects in Ion-Implanted Silicon Observed by Perturbed Angular Correlation
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
1141-1146
DOI
10.4028/www.scientific.net/MSF.10-12.1141
Citation
M. Deicher, G. Grübel, E. Recknagel, T. Wichert, "Structural Defects in Ion-Implanted Silicon Observed by Perturbed Angular Correlation", Materials Science Forum, Vols. 10-12, pp. 1141-1146, 1986
Online since
January 1986
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Price
$32.00
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