Paper Title:
Effects of Annealing on Electron Trap and Free Carrier Concentration in n-Type GaAs
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
1213-1218
DOI
10.4028/www.scientific.net/MSF.10-12.1213
Citation
C. Ghezzi, E. Gombia, L. Vanzetti, "Effects of Annealing on Electron Trap and Free Carrier Concentration in n-Type GaAs", Materials Science Forum, Vols. 10-12, pp. 1213-1218, 1986
Online since
January 1986
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Price
$32.00
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