Detection of Non Stoichiometric Vacancy Defects in CdTe, HgTe and Hg1-x CdxTe by Positron Annihilation |
| Journal |
Materials Science Forum (Volumes 10 - 12) |
| Volume |
Defects in Semiconductors 14 |
| Edited by |
H.J. von Bardeleben |
| Pages |
1241-1246 |
| DOI |
10.4028/www.scientific.net/MSF.10-12.1241 |
| Citation |
B. Geffroy et al., 1986, Materials Science Forum, 10-12, 1241 |
| Authors |
B. Geffroy, C. Corbel, M. Stucky, R. Triboulet, Pekka J. Hautojärvi, F. Plazaola, Kimmo Saarinen, H. Rajainmäki, J. Aaltonen, P. Moser, A Sengupta, J.L. Pautrat |
| Full Paper |
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