An Overview of Electron Paramagnetic Resonance Studies of Si-SiO2 Interface States |
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| Journal | Materials Science Forum (Volumes 10 - 12) |
|---|---|
| Volume | Defects in Semiconductors 14 |
| Edited by | H.J. von Bardeleben |
| Pages | 181-188 |
| DOI | 10.4028/www.scientific.net/MSF.10-12.181 |
| Citation | K.L. Brower, 1986, Materials Science Forum, 10-12, 181 |
| Authors | K.L. Brower |
| Full Paper | 
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