Paper Title:
Characterization of Electron Traps in GaAs-GaAlAs Superlattices
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
199-204
DOI
10.4028/www.scientific.net/MSF.10-12.199
Citation
F. Sillion, A. Mauger, J.C. Bourgoin, B. Deveaud, A. Regreny, D. Stiévenard, "Characterization of Electron Traps in GaAs-GaAlAs Superlattices", Materials Science Forum, Vols. 10-12, pp. 199-204, 1986
Online since
January 1986
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Price
$35.00
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