Paper Title:
Atomic Imaging of Surface Defects on Si
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
211-216
DOI
10.4028/www.scientific.net/MSF.10-12.211
Citation
J.E. Demuth, R.J. Hamers, R.M. Tromp, "Atomic Imaging of Surface Defects on Si", Materials Science Forum, Vols. 10-12, pp. 211-216, 1986
Online since
January 1986
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Price
$32.00
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