Electronic Structures of Substitutional Off-Center and Small-Aggregate Defects in Silicon by Semi-Empirical Green's Function Methods |
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| Journal | Materials Science Forum (Volumes 10 - 12) |
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| Volume | Defects in Semiconductors 14 |
| Edited by | H.J. von Bardeleben |
| Pages | 31-36 |
| DOI | 10.4028/www.scientific.net/MSF.10-12.31 |
| Authors | Gary G. DeLeo, W. Beall Fowler, Geralyn W. Barry, Morgan Besson |
| Full Paper | 
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