Paper Title:
Trapping Characteristics and Analysis of Te-Related DX Centers in AlGaAs and GaAsP
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
411-416
DOI
10.4028/www.scientific.net/MSF.10-12.411
Citation
E. Muñoz Merino, A. Gómez, E. Calleja, J.J. Criado, J.M. Herrero, F. Sandoval, "Trapping Characteristics and Analysis of Te-Related DX Centers in AlGaAs and GaAsP", Materials Science Forum, Vols. 10-12, pp. 411-416, 1986
Online since
January 1986
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Price
$32.00
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