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Tight-Binding Study of the Silicon Divacancy

Journal Materials Science Forum (Volumes 10 - 12)
Volume Defects in Semiconductors 14
Edited by H.J. von Bardeleben
Pages 43-48
DOI 10.4028/www.scientific.net/MSF.10-12.43
Citation P. Pecheur et al., 1986, Materials Science Forum, 10-12, 43
Authors P. Pecheur, G. Toussaint
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