Paper Title:
Stress Effects of Deep Centers in Si, New Method to Determine Old Parameter Ξμ
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
469-474
DOI
10.4028/www.scientific.net/MSF.10-12.469
Citation
M. F. Li, J. X. Chen, X. S. Zhao, Y. J. Li, "Stress Effects of Deep Centers in Si, New Method to Determine Old Parameter Ξμ ", Materials Science Forum, Vols. 10-12, pp. 469-474, 1986
Online since
January 1986
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Price
$35.00
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