Paper Title:
Accurate Determination of Capture Time Constant of Interface States in MOS Structures
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
499-504
DOI
10.4028/www.scientific.net/MSF.10-12.499
Citation
D. Vuillaume, J. Barrier, D. Stiévenard, J.C. Bourgoin, "Accurate Determination of Capture Time Constant of Interface States in MOS Structures", Materials Science Forum, Vols. 10-12, pp. 499-504, 1986
Online since
January 1986
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Price
$32.00
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