Paper Title:
Application of Optically Detected Magnetic Resonance to the Characterization of Point Defects in Semiconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
505-514
DOI
10.4028/www.scientific.net/MSF.10-12.505
Citation
J. M. Spaeth, "Application of Optically Detected Magnetic Resonance to the Characterization of Point Defects in Semiconductors", Materials Science Forum, Vols. 10-12, pp. 505-514, 1986
Online since
January 1986
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Price
$32.00
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