Paper Title:
Scanning Transmission Electron Beam Induced Current in Polycrystalline Silicon
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
545-550
DOI
10.4028/www.scientific.net/MSF.10-12.545
Citation
C. Cabanel, J.L. Maurice, J.Y. Laval, "Scanning Transmission Electron Beam Induced Current in Polycrystalline Silicon", Materials Science Forum, Vols. 10-12, pp. 545-550, 1986
Online since
January 1986
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Price
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