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Calculation of the Spin-Polarized Electronic Structure of Si: Feoi in Super-Cell Full-Potential Linearized Augumented Plane Wave Method

Journal Materials Science Forum (Volumes 10 - 12)
Volume Defects in Semiconductors 14
Edited by H.J. von Bardeleben
Pages 61-66
DOI 10.4028/www.scientific.net/MSF.10-12.61
Citation Hiroshi Katayama-Yoshida et al., 1986, Materials Science Forum, 10-12, 61
Authors Hiroshi Katayama-Yoshida, N. Hamada
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