Evidence for an Inhomogeneous Distribution of Thermal Donors in Silicon from Electrical and Optical Measurements |
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| Journal | Materials Science Forum (Volumes 10 - 12) |
|---|---|
| Volume | Defects in Semiconductors 14 |
| Edited by | H.J. von Bardeleben |
| Pages | 979-984 |
| DOI | 10.4028/www.scientific.net/MSF.10-12.979 |
| Citation | Joerg Weber et al., 1986, Materials Science Forum, 10-12, 979 |
| Authors | Joerg Weber, K. Köhler, F.J. Stützler, H.J. Queisser |
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