Paper Title:
Properties of the Shallow Thermal Donors in CZ-Silicon as Studied by Photothermal Ionization Spectroscopy (PTIS)
  Abstract

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Periodical
Materials Science Forum (Volumes 10-12)
Edited by
H.J. von Bardeleben
Pages
997-1002
DOI
10.4028/www.scientific.net/MSF.10-12.997
Citation
J.A. Griffin, H. Navarro, J. Weber, L. Genzel, "Properties of the Shallow Thermal Donors in CZ-Silicon as Studied by Photothermal Ionization Spectroscopy (PTIS)", Materials Science Forum, Vols. 10-12, pp. 997-1002, 1986
Online since
January 1986
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