Paper Title:
Characterisation of an SiO2/Si Interface with Slow Positrons
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 105-110)
Edited by
Zs. Kajcsos and Cs. Szeles
Pages
1451-1454
DOI
10.4028/www.scientific.net/MSF.105-110.1451
Citation
D.L. Smith, C. Smith, P.C. Rice-Evans, J.H. Evans-Freeman, H. E. Evans, "Characterisation of an SiO2/Si Interface with Slow Positrons", Materials Science Forum, Vols. 105-110, pp. 1451-1454, 1992
Online since
January 1992
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Price
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