Paper Title:
Vacancy-Type Defects in Si+- and B+-Implanted Si Probed by a Monoenergetic Positron Beam
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 105-110)
Edited by
Zs. Kajcsos and Cs. Szeles
Pages
1479-1482
DOI
10.4028/www.scientific.net/MSF.105-110.1479
Citation
A. Uedono, L. Wei, Y. Tabuki, H. Kondo, S. Tanigawa, J. Sugiura, M. Ogasawara, "Vacancy-Type Defects in Si+- and B+-Implanted Si Probed by a Monoenergetic Positron Beam", Materials Science Forum, Vols. 105-110, pp. 1479-1482, 1992
Online since
January 1992
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