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Vacancies in II-VI- and IV-VI Compound Semiconductors Studied by Positron Lifetime Spectroscopy

Journal Materials Science Forum (Volumes 105 - 110)
Volume Positron Annihilation - ICPA-9
Edited by Zs. Kajcsos and Cs. Szeles
Pages 333-340
DOI 10.4028/www.scientific.net/MSF.105-110.333
Citation R. Krause et al., 1992, Materials Science Forum, 105-110, 333
Authors R. Krause, M. Neubert, Th. Drost, W. Hörstel, A. Polity, F.M. Kiessling, U. Paitz, V.P. Zlomanov, S. Mäkinen
Keywords CdHgTe, Compound Semiconductor, PbSe, Specific Positron Trapping Rates
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