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Positron Trapping Model in N-Type Semiconductors with Vacancies

Journal Materials Science Forum (Volumes 105 - 110)
Volume Positron Annihilation - ICPA-9
Edited by Zs. Kajcsos and Cs. Szeles
Pages 985-988
DOI 10.4028/www.scientific.net/MSF.105-110.985
Citation Masao Doyama, 1992, Materials Science Forum, 105-110, 985
Authors Masao Doyama
Keywords Charged Vacancies, P-Type Semiconductors, Semiconductor, Trapping, Vacancy
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