Transmission Electron Microscopy and Microanalysis of Extended Defects in Ceramics |
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| Journal | Materials Science Forum (Volume 116) |
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| Volume | Defects in Electronic Ceramics |
| Edited by | S. Pizzini |
| Pages | 149-168 |
| DOI | 10.4028/www.scientific.net/MSF.116.149 |
| Citation | J. Ayache et al., 1993, Materials Science Forum, 116, 149 |
| Authors | J. Ayache, J. Castaing |
| Full Paper | 
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