Paper Title:
Measurement of Interstitial Oxygen Striations in Silicon Single Crystals Using the Micro-FTIR Method
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 117-118)
Edited by
Tsunemasa Taguchi
Pages
189-194
DOI
10.4028/www.scientific.net/MSF.117-118.189
Citation
E. Iino, I. Fusegawa, H. Yamagishi, "Measurement of Interstitial Oxygen Striations in Silicon Single Crystals Using the Micro-FTIR Method ", Materials Science Forum, Vols. 117-118, pp. 189-194, 1993
Online since
January 1993
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