Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce, Er) in Silicon |
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| Journal | Materials Science Forum (Volumes 117 - 118) |
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| Volume | Shallow Impurities in Semiconductors V |
| Edited by | Tsunemasa Taguchi |
| Pages | 279-284 |
| DOI | 10.4028/www.scientific.net/MSF.117-118.279 |
| Citation | H. Nakayama et al., 1993, Materials Science Forum, 117-118, 279 |
| Authors | H. Nakayama, A. Matsuura, M. Kohno, Taneo Nishino |
| Keywords | Hall-Effect, Rare-Earth-Metal, Silicon |
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