Paper Title:
Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates
  Abstract

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Periodical
Materials Science Forum (Volumes 119-121)
Edited by
L.B. Magalas and S. Gorczyca
Pages
273-278
DOI
10.4028/www.scientific.net/MSF.119-121.273
Citation
H.G. Bohn, C.M. Su, "Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates ", Materials Science Forum, Vols. 119-121, pp. 273-278, 1993
Online since
January 1993
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Price
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