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Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates

Journal Materials Science Forum (Volumes 119 - 121)
Volume Internal Friction and Ultrasonic Attenuation in Solids
Edited by L.B. Magalas and S. Gorczyca
Pages 273-278
DOI 10.4028/www.scientific.net/MSF.119-121.273
Citation H.G. Bohn et al., 1993, Materials Science Forum, 119-121, 273
Authors H.G. Bohn, C.M. Su
Keywords Al-Alloy Thin Films, Grain Boundary Relaxation
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