Paper Title:
Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements
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Periodical
Materials Science Forum (Volumes 126-128)
Edited by
Ph. Komninou and A. Rocher
Pages
463-466
DOI
10.4028/www.scientific.net/MSF.126-128.463
Citation
P. Gladkov, K. Varblianska, T. Marinova, V. Krastev, J. Stoemenos, "Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements ", Materials Science Forum, Vols. 126-128, pp. 463-466, 1993
Online since
January 1993
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