Paper Title:
Determination of the Chemical Valence of Atoms at a Heterophase Interface by X-Ray Diffraction Measurements of Crystal Truncation Rod Intensity at an Atomic Absorption Edge
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Periodical
Materials Science Forum (Volumes 126-128)
Edited by
Ph. Komninou and A. Rocher
Pages
575-578
DOI
10.4028/www.scientific.net/MSF.126-128.575
Citation
E.D. Specht, F.J. Walker, "Determination of the Chemical Valence of Atoms at a Heterophase Interface by X-Ray Diffraction Measurements of Crystal Truncation Rod Intensity at an Atomic Absorption Edge", Materials Science Forum, Vols. 126-128, pp. 575-578, 1993
Online since
January 1993
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Price
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