Determination of the Chemical Valence of Atoms at a Heterophase Interface by X-Ray Diffraction Measurements of Crystal Truncation Rod Intensity at an Atomic Absorption Edge
| Periodical | Materials Science Forum (Volumes 126 - 128) |
|---|---|
| Main Theme | Intergranular and Interphase Boundaries in Materials |
| Edited by | Ph. Komninou and A. Rocher |
| Pages | 575-578 |
| DOI | 10.4028/www.scientific.net/MSF.126-128.575 |
| Citation | E.D. Specht et al., 1993, Materials Science Forum, 126-128, 575 |
| Authors | E.D. Specht, F.J. Walker |
| Keywords | Al2O3, Cr2O3, Interface Structure, X-Ray Diffraction (XRD) |
| Price | US$ 28,- |