Paper Title:

Determination of the Chemical Valence of Atoms at a Heterophase Interface by X-Ray Diffraction Measurements of Crystal Truncation Rod Intensity at an Atomic Absorption Edge

Periodical Materials Science Forum (Volumes 126 - 128)
Main Theme Intergranular and Interphase Boundaries in Materials
Edited by Ph. Komninou and A. Rocher
Pages 575-578
DOI 10.4028/www.scientific.net/MSF.126-128.575
Citation E.D. Specht et al., 1993, Materials Science Forum, 126-128, 575
Authors E.D. Specht, F.J. Walker
Keywords Al2O3, Cr2O3, Interface Structure, X-Ray Diffraction (XRD)
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