Paper Title:
Analysis of SiC-SiO2 Interfaces by TEM
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 126-128)
Edited by
Ph. Komninou and A. Rocher
Pages
599-602
DOI
10.4028/www.scientific.net/MSF.126-128.599
Citation
F. Gourbilleau, G. Nouet, "Analysis of SiC-SiO2 Interfaces by TEM", Materials Science Forum, Vols. 126-128, pp. 599-602, 1993
Online since
January 1993
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Price
$32.00
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