Materials Science & Technology

FULLTEXT SEARCH
NEW: Advanced Search

Symmetric (011)Tilt Grain Boundaries in Si and Ge: Interfacial Dislocation Concept

Journal Materials Science Forum (Volumes 126 - 128)
Volume Intergranular and Interphase Boundaries in Materials
Edited by Ph. Komninou and A. Rocher
Pages 73-76
DOI 10.4028/www.scientific.net/MSF.126-128.73
Citation Jean-Luc Putaux et al., 1993, Materials Science Forum, 126-128, 73
Authors Jean-Luc Putaux, J. Thibault, Alain Jacques, A. George
Keywords Grain Boundary Dislocation, High Resolution Electron Microscopy (HREM), Structural Unit
Full Paper PDF Get the full paper by clicking here

First page example

Preview of first page