Symmetric (011)Tilt Grain Boundaries in Si and Ge: Interfacial Dislocation Concept |
|
| Journal | Materials Science Forum (Volumes 126 - 128) |
|---|---|
| Volume | Intergranular and Interphase Boundaries in Materials |
| Edited by | Ph. Komninou and A. Rocher |
| Pages | 73-76 |
| DOI | 10.4028/www.scientific.net/MSF.126-128.73 |
| Citation | Jean-Luc Putaux et al., 1993, Materials Science Forum, 126-128, 73 |
| Authors | Jean-Luc Putaux, J. Thibault, Alain Jacques, A. George |
| Keywords | Grain Boundary Dislocation, High Resolution Electron Microscopy (HREM), Structural Unit |
| Full Paper |
Get the full paper by clicking here
|
