HREM Imaging and Simulation of Stacking Faults in HoBa2Cu3O7-x Superconductors |
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| Journal | Materials Science Forum (Volume 129) |
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| Volume | Atomic Structures of High-Tc Superconductors |
| Edited by | K.H. Kuo and J.P. Zhang |
| Pages | 155-164 |
| DOI | 10.4028/www.scientific.net/MSF.129.155 |
| Citation | Y. Yan et al., 1993, Materials Science Forum, 129, 155 |
| Authors | Y. Yan, M.G. Blanchin |
| Keywords | High Resolution Electron Microscopy (HREM), Stacking Fault, Superconductor |
| Full Paper | 
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