Structural Characterization of Epitaxial YBa2Cu3O7 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy |
| Journal |
Materials Science Forum (Volume 129) |
| Volume |
Atomic Structures of High-Tc Superconductors |
| Edited by |
K.H. Kuo and J.P. Zhang |
| Pages |
99-118 |
| DOI |
10.4028/www.scientific.net/MSF.129.99 |
| Citation |
C.L. Jia et al., 1993, Materials Science Forum, 129, 99 |
| Authors |
C.L. Jia, B. Kabius, K. Urban |
| Keywords |
Film Growth, Grain Boundary, High Resolution Electron Microscopy (HREM), Step-Edge Junction, Thin Film |
| Full Paper |
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