Paper Title:
Structural Characterization of Epitaxial YBa2Cu3O7 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy
  Abstract

  Info
Periodical
Edited by
K.H. Kuo and J.P. Zhang
Pages
99-118
DOI
10.4028/www.scientific.net/MSF.129.99
Citation
C.L. Jia, B. Kabius, K. Urban, "Structural Characterization of Epitaxial YBa2Cu3O7 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy ", Materials Science Forum, Vol. 129, pp. 99-118, 1993
Online since
January 1993
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