Paper Title:
X-Ray Analysis of Residual Stresses and Textures in Thin Coatings
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 133-136)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
117-124
DOI
10.4028/www.scientific.net/MSF.133-136.117
Citation
A. Schubert, B. Kämpfe, E. Auerswald, "X-Ray Analysis of Residual Stresses and Textures in Thin Coatings", Materials Science Forum, Vols. 133-136, pp. 117-124, 1993
Online since
January 1993
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Price
$32.00
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