Paper Title:
XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 133-136)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
157-162
DOI
10.4028/www.scientific.net/MSF.133-136.157
Citation
L. Wcislak, H. J. Bunge, C. Nauer-Gerhardt, "XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique", Materials Science Forum, Vols. 133-136, pp. 157-162, 1993
Online since
January 1993
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Price
$32.00
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