Paper Title:
New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
  Abstract

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Periodical
Materials Science Forum (Volumes 133-136)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
163-168
DOI
10.4028/www.scientific.net/MSF.133-136.163
Citation
G. Bermig, J. Tobisch, K. Richter, K. Helming, "New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction", Materials Science Forum, Vols. 133-136, pp. 163-168, 1993
Online since
January 1993
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Price
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