X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers |
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| Journal | Materials Science Forum (Volumes 133 - 136) |
|---|---|
| Volume | European Powder Diffraction |
| Edited by | R. Delhez and E.J. Mittemeijer |
| Pages | 175-180 |
| DOI | 10.4028/www.scientific.net/MSF.133-136.175 |
| Citation | I. Tomov, 1993, Materials Science Forum, 133-136, 175 |
| Authors | I. Tomov |
| Full Paper | 
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