Paper Title:
Glancing-Incidence X-Ray Analysis of Thin Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 133-136)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
231-236
DOI
10.4028/www.scientific.net/MSF.133-136.231
Citation
D.K.G. De Boer, W.W. van den Hoogenhof, "Glancing-Incidence X-Ray Analysis of Thin Films", Materials Science Forum, Vols. 133-136, pp. 231-236, 1993
Online since
January 1993
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Price
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