Paper Title:
X-Ray Diffraction Examination of Structure and Stability of Amorphous Cu-W Thin Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 133-136)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
913-920
DOI
10.4028/www.scientific.net/MSF.133-136.913
Citation
B. Gržeta, N. Radić, D. Gracin, T. Doslic, "X-Ray Diffraction Examination of Structure and Stability of Amorphous Cu-W Thin Films", Materials Science Forum, Vols. 133-136, pp. 913-920, 1993
Online since
January 1993
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.