Paper Title:
Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon
  Abstract

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Periodical
Materials Science Forum (Volumes 143-147)
Edited by
Helmut Heinrich and Wolfgang Jantsch
Pages
1345-1352
DOI
10.4028/www.scientific.net/MSF.143-147.1345
Citation
W.M. Chen, B. Monemar, A.M. Frens, M.T. Bennebroek, J. Schmidt, "Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon", Materials Science Forum, Vols. 143-147, pp. 1345-1352, 1994
Online since
October 1993
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Price
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