Paper Title:
Observation of Rapid Direct Charge Transfer between Deep Defects in Silicon
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 143-147)
Edited by
Helmut Heinrich and Wolfgang Jantsch
Pages
1371-1374
DOI
10.4028/www.scientific.net/MSF.143-147.1371
Citation
A.M. Frens, M.T. Bennebroek, A.J. Zakrzewski, J. Schmidt, W.M. Chen, E. Janzén, J. L. Lindström, B. Monemar, "Observation of Rapid Direct Charge Transfer between Deep Defects in Silicon", Materials Science Forum, Vols. 143-147, pp. 1371-1374, 1994
Online since
October 1993
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