Paper Title:
Electrical Characterization of Surface Defects on Porous p-Type Silicon
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 143-147)
Edited by
Helmut Heinrich and Wolfgang Jantsch
Pages
1475-1480
DOI
10.4028/www.scientific.net/MSF.143-147.1475
Citation
C. Cadet, D. Deresmes, D. Vuillaume, D. Stiévenard, A. Grosman, C. Ortega, J. Siejka, H. J. von Bardeleben, "Electrical Characterization of Surface Defects on Porous p-Type Silicon", Materials Science Forum, Vols. 143-147, pp. 1475-1480, 1994
Online since
October 1993
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.