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Influence of Micro-Inhomogeneities on the Electron Mobility in Undoped N-Type LEC GaAs

Journal Materials Science Forum (Volumes 143 - 147)
Volume Defects in Semiconductors 17
Edited by Helmut Heinrich and Wolfgang Jantsch
Pages 1565-1570
DOI 10.4028/www.scientific.net/MSF.143-147.1565
Citation W. Siegel et al., 1993, Materials Science Forum, 143-147, 1565
Authors W. Siegel, G. Kühnel, Hartmut Witte, U. Kretzer
Keywords Electron Mobility, GaAs, Hall-Effect, LEC, Non-Uniformity
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