The Excited 5T1 State of the Feio -Center in Silicon |
| Journal |
Materials Science Forum (Volumes 143 - 147) |
| Volume |
Defects in Semiconductors 17 |
| Edited by |
Helmut Heinrich and Wolfgang Jantsch |
| Pages |
165-170 |
| DOI |
10.4028/www.scientific.net/MSF.143-147.165 |
| Citation |
A. Thilderkvist et al., 1993, Materials Science Forum, 143-147, 165 |
| Authors |
A. Thilderkvist, G. Grossmann, Mats Kleverman, Hermann G. Grimmeiss |
| Keywords |
FTIR, Interstitial, Iron, Jahn-Teller, Silicon |
| Full Paper |
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