Paper Title:
On the Sensitivity of Optical Reflectivity Spectra to the Bulk Defects in Semiconductors - Example of Crystalline Si
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Periodical
Materials Science Forum (Volumes 143-147)
Edited by
Helmut Heinrich and Wolfgang Jantsch
Pages
183-188
DOI
10.4028/www.scientific.net/MSF.143-147.183
Citation
R. Iwanowski , B.J. Kowalski, B.A. Orłowski, J. Bak-Misiuk, "On the Sensitivity of Optical Reflectivity Spectra to the Bulk Defects in Semiconductors - Example of Crystalline Si", Materials Science Forum, Vols. 143-147, pp. 183-188, 1994
Online since
October 1993
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