Paper Title:
Detection of Defects Responsible for Lifetime in p-Type Si
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 143-147)
Edited by
Helmut Heinrich and Wolfgang Jantsch
Pages
189-194
DOI
10.4028/www.scientific.net/MSF.143-147.189
Citation
M. Zazoui, J.C. Bourgoin, D. Stiévenard, D. Deresmes, "Detection of Defects Responsible for Lifetime in p-Type Si", Materials Science Forum, Vols. 143-147, pp. 189-194, 1994
Online since
October 1993
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Price
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