Paper Title:
Characterization of Semiconductor Surfaces and Interfaces by X-Ray Reflectivity Measurements
  Abstract

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Periodical
Materials Science Forum (Volumes 143-147)
Edited by
Helmut Heinrich and Wolfgang Jantsch
Pages
561-566
DOI
10.4028/www.scientific.net/MSF.143-147.561
Citation
W. Plotz, V. Holy, W.V.D. Hoogenhof, W. Ahrer, N. Frank, C. Schiller, K. Lischka, "Characterization of Semiconductor Surfaces and Interfaces by X-Ray Reflectivity Measurements", Materials Science Forum, Vols. 143-147, pp. 561-566, 1994
Online since
October 1993
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