Endor and ODEPR Investigation of the Microscopic Structure of the Boron Acceptor in 6H-SiC |
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| Journal | Materials Science Forum (Volumes 143 - 147) |
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| Volume | Defects in Semiconductors 17 |
| Edited by | Helmut Heinrich and Wolfgang Jantsch |
| Pages | 63-68 |
| DOI | 10.4028/www.scientific.net/MSF.143-147.63 |
| Authors | J. Reinke, Ralf Müller, M. Feege, Siegmund Greulich-Weber, Johann Martin Spaeth |
| Keywords | 6H-SiC, Acceptor, ENDOR, Optically Detected EPR |
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