Endor and ODEPR Investigation of the Microscopic Structure of the Boron Acceptor in 6H-SiC |
| Journal |
Materials Science Forum (Volumes 143 - 147) |
| Volume |
Defects in Semiconductors 17 |
| Edited by |
Helmut Heinrich and Wolfgang Jantsch |
| Pages |
63-68 |
| DOI |
10.4028/www.scientific.net/MSF.143-147.63 |
| Citation |
J. Reinke et al., 1993, Materials Science Forum, 143-147, 63 |
| Authors |
J. Reinke, Ralf Müller, M. Feege, Siegmund Greulich-Weber, Johann Martin Spaeth |
| Keywords |
6H-SiC, Acceptor, ENDOR, Optically Detected EPR |
| Full Paper |
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