Paper Title:
TEM and In Situ HREM for Studying Metal-Semiconductor Interfacial Reactions
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 155-156)
Edited by
Y. Limoge and J.L. Bocquet
Pages
111-120
DOI
10.4028/www.scientific.net/MSF.155-156.111
Citation
R. Sinclair, T. J. Konno, D. Hong Ko, "TEM and In Situ HREM for Studying Metal-Semiconductor Interfacial Reactions ", Materials Science Forum, Vols. 155-156, pp. 111-120, 1994
Online since
May 1994
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Price
$32.00
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