Absolute Atomic Scale Measurements of the Gibbsian Interfacial Excess of Solute at Grain Boundaries in an Iron (Silicon) Alloy |
| Journal |
Materials Science Forum (Volumes 155 - 156) |
| Volume |
Reactive Phase Formation at Interfaces and Diffusion Processes |
| Edited by |
Y. Limoge and J.L. Bocquet |
| Pages |
393-396 |
| DOI |
10.4028/www.scientific.net/MSF.155-156.393 |
| Citation |
B.W. Krakauer et al., 1994, Materials Science Forum, 155-156, 393 |
| Authors |
B.W. Krakauer, David N. Seidman |
| Keywords |
Atom-Probe Field-Ion Microscopy, Equilibrium Segregation, Fe(Si), Gibbsian Interfacial Excess of Solute, Grain Boundary, Grain Boundary Degrees of Freedom, TEM |
| Full Paper |
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