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The Composition and Structure of the Cu/MgO {222} Heterophase Interface on an Atomic Scale

Journal Materials Science Forum (Volumes 155 - 156)
Volume Reactive Phase Formation at Interfaces and Diffusion Processes
Edited by Y. Limoge and J.L. Bocquet
Pages 397-400
DOI 10.4028/www.scientific.net/MSF.155-156.397
Citation H. Jang et al., 1994, Materials Science Forum, 155-156, 397
Authors H. Jang, David N. Seidman, K.L. Merkle
Keywords Atom-Probe Field-Ion Microscopy, Ceramic Interface, Cu/MgO Heterophase Interface, High Resolution Electron Microscopy (HREM), Internal Oxidation, Metal Interface, Precipitation, Semicoherent Interface
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