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Defect Injection and Diffusion in Semiconductors

Journal Materials Science Forum (Volumes 155 - 156)
Volume Reactive Phase Formation at Interfaces and Diffusion Processes
Edited by Y. Limoge and J.L. Bocquet
Pages 475-492
DOI 10.4028/www.scientific.net/MSF.155-156.475
Citation Nicolaas Stolwijk et al., 1994, Materials Science Forum, 155-156, 475
Authors Nicolaas Stolwijk, Hartmut Bracht, H.-G. Hettwer, Wilfried Lerch, Helmut Mehrer, A. Rucki, W. Jäger
Keywords Dislocations, Gallium Arsenide, Kick-Out Mechanism, Nitridation, Oxidation, Precipitation, Self-Interstitial, Silicidation, Silicon, Stacking Fault, Vacancy, Void
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