Paper Title:
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 157-162)
Edited by
H.J. Bunge
Pages
137-142
DOI
10.4028/www.scientific.net/MSF.157-162.137
Citation
J. Hjelen, A.H. Qvale, Ø. Gomo, "Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality ", Materials Science Forum, Vols. 157-162, pp. 137-142, 1994
Online since
May 1994
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Price
$32.00
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