Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality |
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| Journal | Materials Science Forum (Volumes 157 - 162) |
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| Volume | Textures of Materials - ICOTOM 10 |
| Edited by | H.J. Bunge |
| Pages | 137-142 |
| DOI | 10.4028/www.scientific.net/MSF.157-162.137 |
| Citation | Jarle Hjelen et al., 1994, Materials Science Forum, 157-162, 137 |
| Authors | Jarle Hjelen, A.H. Qvale, Ø. Gomo |
| Keywords | CCD Camera, Electron Backscattered Pattern (EBSP), Pattern Resolution, Spatial Resolution |
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